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139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing

    Buy cheap 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing from wholesalers
     
    Buy cheap 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing from wholesalers
    • Buy cheap 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing from wholesalers
    • Buy cheap 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing from wholesalers

    139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing

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    Brand Name : HUATEC
    Model Number : H3543HWF-AG
    Certification : CE ISO GOST
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    139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing

    139 Micron Amorphous Silicon A-Si Curved A-Si DR And Non-Destructive Testing


    H3543HWF-AG It is a portable wireless flat detector based on amorphous silicon surface sensor, suitable for pipeline inspection, industrial inspection, non-destructive testing and other fields


    Sensor
    Receptor Type a-Si

    Scintillator Gos

    Active Area 350 x 430 mm

    Resolution 2560 x 3072

    Pixel Pitch 139 μm

    Power Supply & Battery

    Adapter In AC 100-240V,50-60Hz

    Adapter Out DC 24V,2.7A

    Power Dissipation <20 W

    Battery working time 6.5 h

    Charging time 4.5 h


    Image Quality
    Limiting Resolution 3.5 LP/mm

    Energy Range 40-350 KV

    Dynamic Range ≥84 dB

    Sensitivity ≥0.54 LSB/nGy

    Ghos <1% 1st frame

    DQE 42% @(1 LP/mm)

    28% @(2 LP/mm)

    MTF) 68% @(1 LP/mm)

    38% @(2 LP/mm)

    20% @(3 LP/mm)


    Electricals and interface
    A/D Conversion 16 bits

    Data Interface Gigabit Ethernet/802.11ac 5G

    Acquire Time wired: 1s; wireless: 2s

    Exposure Control Software/outsside

    Inbuilt memory 4 GB DDR4, 8 GB SD card


    Mechanical
    Dimension 583x437x21.8mm
    Weight 4.5kg

    Material Aluminum and magnesium alloys

    Front Panel Carbon fiber


    Enviromental

    Temperature 10-35°C (operating);-10~50°C (storage)

    Humidity 30-70% RH (non-condensing)

    Ingress Protection IP54

    Quality 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing for sale
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